[Oral Presentation]Microwave Reflectometer for Density Measurement on J-TEXT Tokamak

Microwave Reflectometer for Density Measurement on J-TEXT Tokamak
ID:130 Submission ID:35 View Protection:ATTENDEE Updated Time:2020-10-15 19:15:56 Hits:262 Oral Presentation

Start Time:2020-11-04 11:00 (Asia/Shanghai)

Duration:15min

Session:[F] High Magnetic Field Engineering and Fusion Technology » [F1] Session 29

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Abstract
Microwave reflectometer is an essential diagnostic tool with high spatial and temporal resolution for the measurement of plasma density profile. In recent years, a microwave reflectometry system has been developed and optimized on the J-TEXT tokamak. It consists of three parts: Q band (33-50GHz) with extra-ordinary mode (X-mode), V band (50-75GHz) with X mode and Q band with ordinary mode (O-mode). Its measurement range covers from the edge to core of the low field side plasma. To obtain a linear frequency sweep, the dynamic calibration of the voltage control oscillator (VCO) is completed. The profile measured by the reflectometer is in good agreement with the result of the polarimetry.
Keywords
microwave reflectometer,dynamic calibration,density profile
Speaker
Xiehang Ren
Huazhong University of Science and Technology

Submission Author
Xiehang Ren Huazhong University of Science and Technology
Zhoujun Yang Huazhong University of Science and Technology
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